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| Brand Name : | OPTO-EDU | 
| Model Number : | A61.4510 | 
| Certification : | CE, Rohs | 
| Price : | FOB $1~1000, Depend on Order Quantity | 
| Payment Terms : | L/C, Western Union, T/T, MoneyGram | 
| Supply Ability : | 5000 pcs/ Month | 
| Delivery Time : | 5~20 Days | 


◆ Miniaturized and detachable design, very easy to carry and classroom teaching
◆ The detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan
◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
◆ Side CCD observation system, real-time observation of the probe needle insertion state and positioning of the probe sample scanning area
◆ Spring suspension shockproof method, simple and practical, good shockproof effect
◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%





| A61.4510 | |
| Work Mode | Constant Height Mode Constant Current Mode | 
| Current Spectrum Curve | I-V Curve Current-Distance Curve | 
| XY Scan Range | 5×5um | 
| XY Scan Resolution | 0.05nm | 
| Z Scan Range | 1um | 
| Y Scan Resolution | 0.01nm | 
| Scan Speed | 0.1Hz~62Hz | 
| Scan Angle | 0~360° | 
| Sample Size | Φ≤68mm H≤20mm | 
| XY Stage Moving | 15×15mm | 
| Shock-Absorbing Design | Spring Suspension | 
| Optical Syestem | 1~500x Continous Zoom | 
| Output | USB2.0/3.0 | 
| Software | Win XP/7/8/10 | 
| Microscope | Optical Microscope | Electron Microscope | Scanning Probe Microscope | 
| Max Resolution (um) | 0.18 | 0.00011 | 0.00008 | 
| Remark | Oil immersion 1500x | Imaging diamond carbon atoms | Imaging high-order graphitic carbon atoms | 
|  |  |  | 
| Probe-Sample Interaction | Measure Signal | Information | 
| Force | Electrostatic Force | Shape | 
| Tunnel Current | Current | Shape, Conductivity | 
| Magnetic Force | Phase | Magnetic Structure | 
| Electrostatic Force | Phase | charge distribution | 
| Resolution | Working Condition | Working Temperation | Damge to Sample | Inspection Depth | |
| SPM | Atom Level 0.1nm | Normal, Liquid, Vacuum | Room or Low Temperation | None | 1~2 Atom Level | 
| TEM | Point 0.3~0.5nm Lattice 0.1~0.2nm | High Vaccum | Room Temperation | Small | Usually <100nm | 
| SEM | 6-10nm | High Vaccum | Room Temperation | Small | 10mm @10x 1um @10000x | 
| FIM | Atom Level 0.1nm | Super High Vaccum | 30~80K | Damge | Atom Thickness | 
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